yieldWerx provides Semiconductor and Fabless Semiconductor companies a visual tool to analyze and research design and manufacturing problems. Production problems are the single, most important aspect of ensuring compliance is to specifications. yieldWerx allows these problems to be identified and analyzed during the production process. Analysis

	Statistical Analysis of Functional and parametric Test
	Data Drill Down Capabilities by Facilities, Work Centers, Device Types, Test Programs, Lots, Wafers, and Die
	Reports: Histograms, XY Scatter, Wafer Map, Bin Summary, Box Plots, Parametric Trend Charts, and Parametric Failure Reports
	Interactive Charts with Custom Configuration, Bin Coloring, Tool Tips with Data, and User Manipulation capabilities

Statistics
The yieldWerx platform provides tools to perform mean, standard deviation, Cp, Cpk and Yield.