yieldWerx Semiconductor Test Data Analysis : Best Solution for Semiconductor test data analysis, STDF, ATDF

Welcome to yieldWerx

yieldWerx provides a suite of test data acquisition, analysis and reporting solutions for semiconductor companies/design houses and engineering groups. With easy access to production data, engineering data from manufacturing processes, wafer probe data , final test data as well as other external data sources,

Case Study: yieldWerx helps Texas Instruments
resolve yield and characterization issues

yieldWerx Features and Benefits

yieldWerx allows the product, device and process engineers the ability to quickly study, diagnose and put in place corrective actions enabling fast and efficient product release as well as driving yield enhancements.

With built in support in yieldWerx Database for STDF and ATDF data formats, and the ability to customize to your data formats, yieldWerx is the perfect solution for semiconductor test data analysis. .

yieldWerx Reports

Free Download

Bar Graph Report
Stacked Histogram Report
Parametric Wafer Map
Parametric Trend
Parametric Failure Report
Parametric Histogram
Wafer Map
Parametric Wafer Map
Stacked Wafer Map
Data Extraction
Data Summary
XY Scatter
Box Plot

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Case Study:

yieldWerx helps Texas Instruments
resolve yield and characterization issues