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| Semiconductor
Test Data Analysis Overview |
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yieldWerx
provides a suite of semiconductor test data acquisition, analysis,
and reporting solutions for semiconductor companies, design
houses, and engineering groups. With easy access to semiconductor
production data, STDF, ATDF and semiconductor engineering data
from manufacturing processes, wafer probe data, final semiconductor
test data as well as other external semiconductor test data
analysis sources, yieldWerx allows the product, device, and
process engineer the ability to quickly study semiconductor
test data analysis from STDF, ATDF files, diagnose semiconductor
test data, and put in place corrective actions enabling fast
and efficient product release, as well as driving semiconductor
yield enhancements. Direct upload for STDF, ATDF, CSV/Excel
formats
Flexible Data Import
Start your semiconductor data analysis by uploading a semiconductor
test data file to the yieldWerx database for functional test
semiconductor data analysis and semiconductor characterization.
File formats such as STDF, ATDF, and CSV/Excel opened directly
in yieldWerx for semiconductor data analysis. Upload STDF, ATDF,
CSV files just in one click. |
Versatile Reports
Create Reports quickly and easily for semiconductor data analysis
and semiconductor yield enhancement using entire data columns
or just a selection of your data for semiconductor data analysis
with yieldWerx.
Set different parameters to create Reports for your semiconductor
data analysis and characterization. Semiconductor Data analysis
can be taken from multiple wafers belonging to different Lots
and different Test Programs for a single type of Device. This
is very useful feature when doing correlation analysis on
different test programs or semiconductor products. yieldWerx
Reports also have Custom Bin Coloring features for semiconductor
data analysis.
You can group your semiconductor test data in yieldWerx by
Lot, Wafer, Test Program, User Defined Wafer Groups, or User
Defined Bin Groups. yieldWerx interactive charting capabilities
allow users to read the Die Count, Percentage of Dies in a
particular bar, Total lots or Total wafers in a particular
bar just by using the Mouse Over feature for semiconductor
data analysis.
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HTML Web based output Reports and Charts
for semiconductor data analysis |
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Exportable to Microsoft Excel, Microsoft
PowerPoint |
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Wafer Bin Summary |
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Stacked Histogram, Parametric
Histogram |
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Box Plots |
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Raw Data Extraction |
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Parametric Trend Chart |
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Wafer Map |
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Stacked Wafer Map |
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Parametric Wafer Map |
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Data Summary |
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XY Scatter |
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Parametric Failure Report |
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Complete Control Over Data
yieldWerx provides flexibility to modify semiconductor
test data analysis and run What If Analysis. Users can view
the Raw Data Table with data from Multiple Facilities, multiple
Work Centers, Device Types, Test Programs, Lots, Wafers, and
Die.
Semiconductor data statistical analysis include Mean, Sigma,
Yield, Cp, and Cpk. File formats such as STDF, ATDF, and CSV/
Excel may be opened directly in Yield Power for semiconductor
data analysis. yieldWerx is unique in its feature of providing
users with the ability to modify semiconductor test data once
it has been loaded into the yieldWerx Database. Built on Microsoft
SQL Server, the world's leading Database Technology, Semiconductor
Test Data analysis in yieldWerx can be modified, and statistical
results recalculated to do What If Analysis.
Users can also filter semiconductor test Data by Limits from
the STDF ATDF File, User Limits, Sigma Limits, and Tukey Limits.
yieldWerx interactive interface allows you to do semiconductor
test data analysis, grouping by Lots or Wafers, on the fly.
Interactive Reports
Table and Charting Tools
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Zooming of Charts |
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Tool Tips on Charts |
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Controllable Axis |
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Direct printing |
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Interactive statistical windows |
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Copy to clipboard of all tables and charts |
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Customizable colors |
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Preference setting |
Data Manipulation
yieldWerx provides flexible and customizable Data Extraction
Views that enable test engineers to look at their data, and
run a wide range of statistical analysis on it. Semiconductor
data analysis results include Mean, Sigma, St Dev, Cp, Cpk,
and Yield. Drill down into your data and see die results for
any test parameter.
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Zoom in on data |
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Select data by choice |
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Marking outliers based on choice or sigma
based limits |
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Data Views: yieldWerx allows you to view
data in a user friendly table format, much like the Excel
Spreadsheet you are so used to. Your data is stored in
the yieldWerx database in a format that is easy to drill
down into. |
Raw Data Table
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Facility |
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Lot |
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Work Center |
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Wafer |
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Device Type |
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Die |
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Test Program |
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Statistical Analysis Table
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Gives you the following statistical results
on your data |
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Mean, Sigma, Yield, Cp, Cpk |
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Filter Data by Customizable Limits, Sigma
Limits, and more |
Data Types
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Semiconductor data files: yieldWerx stores
your data from any of the following formats into its database,
and allows you to save your changes to the data. Once
in the yieldWerx Database, you can drill into the Facility,
Work Center, Device Type, Test Program, Lot, Wafer, and
eventually Die Level Data. |
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STDF Files (Standard Test Data
Format Files) |
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ATDF (ASCII Text Data Format Files) |
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CSV |
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KLARF Files (KLA Results Files) |
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WAT (Wafer Acceptance Test) Data
Files |
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PCM Files |
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Semi Assembly Wafer Map Files
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XML/Custom Format Files |
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Excel/CSV Files |
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yieldWerx can be customized on request
to suit your other data sources for your semiconductor
data analysis. |
ATE Equipment Supported
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Teradyne, |
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LTX, |
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Agilent, |
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Credence, |
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Advantest, |
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NPTest. |
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Other ATE data formats can be incorporated.
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Users of yieldWerx
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Device Engineers in the
fab responsible for the product in the fab, and for yield
enhancement and improvements during this time frame |
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Final Test Engineers
working in the Final assembly/ package and test sites
- where final tests are performed after the die is packaged |
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Product Engineers who
are responsible for a given product from first silicon
to its packaged part state. |
These engineers belong to Semiconductor
Foundries, Fabless companies, IDMs, Subcons, and ATE manufacturers. |
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