Welcome to yieldWerx
yieldWerx provides a suite of data analysis acquisition, analysis and reporting solutions for ATE companies/design houses and engineering groups. With easy access to production analysis, engineering analysis from manufacturing processes, wafer probe analysis , final data analysis as well as other external analysis sources,
 
 yieldWerx Features and Benefits
 
 
 
 
 
 
 
    
yieldWerx allows the product, device and process engineers the ability to quickly study, diagnose and put in place corrective actions enabling fast and efficient product release as well as driving yield enhancements.

With built in support in yieldWerx Database for STDF and ATDF analysis formats, and the ability to customize to your analysis formats, yieldWerx is the perfect solution for ATE data analysis analysis.

yieldWerx Reports Free Download
  • Bar Graph Report

  • Stacked Histogram Report

  • Parametric Wafer Map

  • Parametric Trend

  • Parametric Failure Report

  • Parametric Histogram

  • Wafer Map

  • Parametric Wafer Map

  • Stacked Wafer Map

  • Analysis Extraction

  • Analysis Summary

  • XY Scatter

  • Box Plot

Download a free evaluation of yieldWerx

The #1 solution for ATE data analysis analysis.


 

 

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