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yieldWerx allows the product, device and process
engineers the ability to quickly study, diagnose and put in place
corrective actions enabling fast and efficient product release as
well as driving yield enhancements.
With built in support in yieldWerx Database for STDF and ATDF characterization
formats, and the ability to customize to your characterization formats,
yieldWerx is the perfect solution for semiconductor characterization
analysis analysis.
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