Data Manipulation
yieldWerx provides flexible and customizable Data Extraction
Views that enable test engineers to look at their data, and
run a wide range of statistical analysis on it. Semiconductor
data analysis results include Mean, Sigma, St Dev, Cp, Cpk,
and Yield. Drill down into your data and see die results for
any test parameter.
- Zoom in on data
- Select data by choice
- Marking outliers based on choice or sigma based limits
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- Data Views: yieldWerx allows you to view data in a user
friendly table format, much like the Excel Spreadsheet you
are so used to. Your data is stored in the yieldWerx database
in a format that is easy to drill down into
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Raw Data Table
- Facility Lot
- Work Center Wafer
- Device Type Die
- Test Program
Users of yieldWerx
yieldWerx is best solution for the following semiconductor analysis.
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