Welcome to yieldWerx
yieldWerx provides a suite of Data Characterization acquisition, analysis and reporting solutions for test companies/design houses and engineering groups. With easy access to production Characterization, engineering Characterization from manufacturing processes, wafer probe Characterization , final Data Characterization as well as other external Characterization sources,
 
 yieldWerx Features and Benefits
 
 
 
 
 
 
 
    
yieldWerx allows the product, device and process engineers the ability to quickly study, diagnose and put in place corrective actions enabling fast and efficient product release as well as driving yield enhancements.

With built in support in yieldWerx Database for STDF and ATDF Characterization formats, and the ability to customize to your Characterization formats, yieldWerx is the perfect solution for test Data Characterization analysis.

yieldWerx Reports Free Download
  • Bar Graph Report

  • Stacked Histogram Report

  • Parametric Wafer Map

  • Parametric Trend

  • Parametric Failure Report

  • Parametric Histogram

  • Wafer Map

  • Parametric Wafer Map

  • Stacked Wafer Map

  • Characterization Extraction

  • Characterization Summary

  • XY Scatter

  • Box Plot

Download a free evaluation of yieldWerx

The #1 solution for test Data Characterization analysis.


 

 

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