yieldWerx provides
a suite of test data acquisition, analysis and reporting solutions
for semiconductor IC companies/design houses and engineering groups.
With easy access to production data, engineering data from manufacturing
processes, wafer probe data , final test data as well as other
external data sources,
yieldWerx
Features and Benefits
yieldWerx allows the product, device and process
engineers the ability to quickly study, diagnose and put in place
corrective actions enabling fast and efficient product release as
well as driving yield enhancements.
With built in support in yieldWerx Database for STDF and ATDF data
formats, and the ability to customize to your data formats, yieldWerx
is the perfect solution for semiconductor IC test data analysis.
yieldWerx
Reports
Free Download
Bar Graph
Report
Stacked
Histogram Report
Parametric
Wafer Map
Parametric
Trend
Parametric
Failure Report
Parametric
Histogram
Wafer Map
Parametric
Wafer Map
Stacked
Wafer Map
Data
Extraction
Data Summary
XY Scatter
Box Plot
Download a free evaluation
of yieldWerx
The #1 solution for semiconductor IC test data analysis.
