yieldWerx provides
a suite of testing software acquisition, analysis and reporting
solutions for semiconductor companies/design houses and engineering
groups. With easy access to production software, engineering
software from manufacturing processes, wafer probe software
, final testing software as well as other external software sources,
yieldWerx
Features and Benefits
yieldWerx allows the product, device and process
engineers the ability to quickly study, diagnose and put in place
corrective actions enabling fast and efficient product release as
well as driving yield enhancements.
With built in support in yieldWerx Database for STDF and ATDF software
formats, and the ability to customize to your software formats,
yieldWerx is the perfect solution for semiconductor testing software
analysis.
yieldWerx
Reports
Free Download
Bar Graph
Report
Stacked
Histogram Report
Parametric
Wafer Map
Parametric
Trend
Parametric
Failure Report
Parametric
Histogram
Wafer Map
Parametric
Wafer Map
Stacked
Wafer Map
Software
Extraction
Software
Summary
XY Scatter
Box Plot
Download a free evaluation
of yieldWerx
The #1 solution for semiconductor testing software analysis.
