yieldWerx provides
a suite of analysis Histograms acquisition, analysis and reporting
solutions for STDF companies/design houses and engineering groups.
With easy access to production Histograms, engineering Histograms
from manufacturing processes, wafer probe Histograms , final
analysis Histograms as well as other external Histograms sources,
yieldWerx
Features and Benefits
yieldWerx allows the product, device and process
engineers the ability to quickly study, diagnose and put in place
corrective actions enabling fast and efficient product release as
well as driving yield enhancements.
With built in support in yieldWerx Database for STDF and ATDF data
formats, and the ability to customize to your histograms formats,
yieldWerx is the perfect solution for STDF analysis Histograms analysis.
yieldWerx
Reports
Free Download
Bar Graph
Report
Stacked
Histogram Report
Parametric
Wafer Map
Parametric
Trend
Parametric
Failure Report
Parametric
Histogram
Wafer
Map
Parametric
Wafer Map
Stacked
Wafer Map
Histograms
Extraction
Histograms
Summary
XY Scatter
Box Plot
Download a free evaluation
of yieldWerx
The #1 solution for STDF analysis Histograms analysis.
