yieldWerx provides
a suite of Time optimization acquisition, analysis and reporting
solutions for test companies/design houses and engineering groups.
With easy access to production optimization, engineering optimization
from manufacturing processes, wafer probe optimization , final
Time optimization as well as other external optimization sources,
yieldWerx
Features and Benefits
yieldWerx allows the product, device and process
engineers the ability to quickly study, diagnose and put in place
corrective actions enabling fast and efficient product release as
well as driving yield enhancements.
With built in support in yieldWerx Database for STDF and ATDF optimization
formats, and the ability to customize to your optimization formats,
yieldWerx is the perfect solution for test Time optimization analysis.
yieldWerx
Reports
Free Download
Bar Graph
Report
Stacked
Histogram Report
Parametric
Wafer Map
Parametric
Trend
Parametric
Failure Report
Parametric
Histogram
Wafer
Map
Parametric
Wafer Map
Stacked
Wafer Map
Optimization
Extraction
Optimization
Summary
XY Scatter
Box Plot
Download a free evaluation
of yieldWerx
The #1 solution for test Time optimization analysis.
