Welcome to yieldWerx
yieldWerx provides a suite of Yield Enhancement acquisition, software and reporting solutions for semiconductor companies/design houses and engineering groups. With easy access to production Enhancement, engineering software from manufacturing processes, wafer probe Enhancement , final Yield software as well as other external Enhancement sources,
 
 yieldWerx Features and Benefits
 
 
 
 
 
 
 
    
yieldWerx allows the product, device and process engineers the ability to quickly study, diagnose and put in place corrective actions enabling fast and efficient product release as well as driving yield enhancements.

With built in support in yieldWerx Database for STDF and ATDF Enhancement formats, and the ability to customize to your Enhancement formats, yieldWerx is the perfect solution for semiconductor Yield Enhancement software.
yieldWerx Reports Free Download

  • Bar Graph Report

  • Stacked Histogram Report

  • Parametric Wafer Map

  • Parametric Trend

  • Parametric Failure Report

  • Parametric Histogram

  • Wafer Map

  • Parametric Wafer Map

  • Stacked Wafer Map

  • Software Extraction

  • Enhancement Summary

  • XY Scatter

  • Box Plot

Download a free evaluation of yieldWerx

The #1 solution for semiconductor Yield Enhancement software.


 

 
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