yieldWerx provides
a suite of process control acquisition, software and reporting solutions
for yield management companies/design houses and engineering groups.
With easy access to production control, engineering control from manufacturing
processes, wafer probe control , final process control as well as other
external control sources,
yieldWerx
Features and Benefits
yieldWerx allows the product, device and process
engineers the ability to quickly study, diagnose and put in place
corrective actions enabling fast and efficient product release as
well as driving yield enhancements.
With built in support in yieldWerx database for STDF and ATDF control
formats, and the ability to customize to your control formats, yieldWerx
is the perfect solution for yield management process control software.
yieldWerx
Reports
Free Download
Bar Graph
Report
Stacked
Histogram Report
Parametric
Wafer Map
Parametric
Trend
Parametric
Failure Report
Parametric
Histogram
Wafer Map
Parametric
Wafer Map
Stacked
Wafer Map
control
Extraction
control Summary
XY Scatter
Box Plot
Download a free evaluation
of yieldWerx
The #1 solution for yield management process control software.
