yieldWerx provides
a suite of Yield analysis acquisition, Software and reporting
solutions for semiconductor companies/design houses and engineering
groups. With easy access to production analysis, engineering
analysis from manufacturing processes, wafer probe analysis
, final Yield analysis as well as other external analysis sources,
yieldWerx
Features and Benefits
yieldWerx allows the product, device and process
engineers the ability to quickly study, diagnose and put in place
corrective actions enabling fast and efficient product release as
well as driving yield enhancements.
With built in support in yieldWerx Database for STDF and ATDF analysis
formats, and the ability to customize to your analysis formats,
yieldWerx is the perfect solution for semiconductor Yield analysis
Software.
yieldWerx
Reports
Free Download
Bar Graph
Report
Stacked
Histogram Report
Parametric
Wafer Map
Parametric
Trend
Parametric
Failure Report
Parametric
Histogram
Wafer
Map
Parametric
Wafer Map
Stacked
Wafer Map
Analysis
Extraction
Analysis
Summary
XY Scatter
Box Plot
Software
Download a free evaluation
of yieldWerx
The #1 solution for semiconductor Yield analysis Software.
